摘要
采用故障树分析(FTA)方法对探测器组件进行故障树分析及敏感应力分析,确定探测器组件的敏感应力,从而为探测器组件加速试验的开展提供理论依据,为光纤陀螺的寿命评估提供建议。通过广泛收集探测器组件故障信息和分析其物理化学性能、制造工艺和性能参数,并结合探测器组件的工作环境和使用条件,建立了探测器组件的故障树;由故障树定性分析得出探测器组件故障树的最小割集;通过故障模式统计分析,得到噪声电压变大和响应度降低是探测器组件的主要故障模式,针对探测器组件的主要故障模式进行了敏感应力分析,确定温度应力是探测器组件的敏感应力。分析结果表明以温度应力为主要应力对探测器组件进行加速试验是可行的。
The Fault Tree Analysis （FTA） and sensitive stress analysis of photoelectric detector module （PIN-FET） were implemented to confirm the sensitive stress of PIN-FET. Based on that, some theoretical basis could be provided for PIN-FET＇s Accelerated Test （AT） and some advice could be given for the FOG＇s life evaluation. The fault tree of PIN-FET was built in accordance with the operation environment and condition by collecting failure information and analyzing performance parameters, The minimum cut sets were obtained through fault tree qualitative analysis. The increasing of noise pressure and the decreasing of responsivity were found to be the dominant failure modes from the statistical information. After the analysis of sensitive stress for the dominant failure modes, the temperature stress was confirmed to be the sensitive stress of PIN-FET. The analysis result proves that the Accelerated Test under temperature stress for PIN-FET is feasible.
出处
《中国惯性技术学报》
EI
CSCD
2008年第4期497-501,共5页
Journal of Chinese Inertial Technology
基金
国防预研项目(513090601)
关键词
探测器组件
光纤陀螺
故障树分析
故障模式
敏感应力
photoelectric detector module（PIN-FET）
FOG
fault tree analysis
failure mode
sensitive stress
