摘要
本文简要地描述了用矩阵光学方法表示椭圆偏振光特性参数的基本原理,并在此基础上报道首次采用频率调制磁光晶体而研制成功的瞬态椭圆偏振仪及其性能的初步测试结果.
On the basis of brief discussion of the theory of the representation of elliptically polarized light by matrix optics, the paper reports the optical ellipsometer, which is composed of the optical ellipsometry and the technique of photo-magnetic modulation and can be used to measure the millisecond change of the material.structure.Thepreliminary exprimental results are also given.
出处
《华东师范大学学报（自然科学版）》
CAS
CSCD
1990年第4期38-43,共6页
Journal of East China Normal University(Natural Science)
关键词
椭圆偏振
偏振仪
光
瞬态测量
elliptical polarization Stokes vector Mueller matrix photomagnetic modulation FFT linear regression
