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面向ATE的电路板测试性分析及评估方法研究 被引量:9

Study on ATE Oriented Testability Analysis and Evaluation Method for Circuit Board
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摘要 为了客观地评价TPS,保证ATE在电路板测试维修中发挥更大作用,给出了面向ATE的电路板测试性评估方法。通过ATE测试资源分析选择测试点,利用电路故障仿真,建立电路板的测试性模型、生成依赖矩阵,得出电路板故障检测率和隔离率;然后结合ATE测试的可靠性及费用分析,得到电路板平均故障隔离费用和平均故障隔离步数,实现了电路板测试性的综合评估。最后以某装备电路板为例,验证了方法的有效性。 In order to evaluate TPS (Test Program Set) objectively and ensure ATE (Automatic Test Equipment) be used effectively in the maintenance of circuit boards, we bring forward an ATE oriented testability analysis and evaluation method. Firstly, test points are selected through ATE test resource analysis. Then, testability model and dependency matrix are generated by fault simulation. And moreover, the fault detection rate and fault isolation rate of circuit board can be calculated based on the matrix. Combined with reliability and cost analysis, we can also further get mean fault isolation cost and mean fault isolation step. As a result, the testability of circuit board can be evaluated comprehensively with these indexes. Finally, an example proves that our method is feasible and effective.
出处 《电子器件》 CAS 2008年第5期1599-1602,共4页 Chinese Journal of Electron Devices
关键词 测试性分析 测试性评估 ATE testability analysis testability evaluation ATE
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  • 1张波,陈岩申,王桂芝.海军某型声纳电路板测试程序集(TPS)开发研究[J].仪器仪表学报,2002,23(z1):251-253. 被引量:17
  • 2石君友,康锐,田仲.测试性试验中样本集的测试覆盖充分性研究[J].测控技术,2004,23(12):19-21. 被引量:5
  • 3石君友,康锐,田仲.基于信息模型的测试性试验样本集充分性研究[J].北京航空航天大学学报,2005,31(8):874-878. 被引量:15
  • 4[1]VMEbus Extensions for Instrumentation-VXIbus System.Speciation,Revision 1.3July 14,1989.
  • 5Deb S,Pattipati K R,Raghavan V,et al.Multi-signal flow graphs:a novel approach for system testability analysis and fault diagnosis[A].Proc.IEEE AUTOTESTCON 1994[C].1994:361-373.
  • 6Deb S,Pattipati K R,Shrestha R.QSI's Integrated Diagnostics Toolset[A].Proc.IEEE AUTOTESTCON 1997[C].1997:408-421.
  • 7Deb S,Ghoshal S,Mathur A,et al.Multisignal modeling for diagnosis,FMECA,and reliability[A].Proceedings of the IEEE International Conference on Systems,Man,and Cybernetics[C].1998:3026-3031.
  • 8Mei-Chen Hsueb,Timothy K.Tsai and Ravisbankar K.Iyer.Fault Injection Techniques and Tools[J].Computer,1997,30(4 ):75-82.
  • 9LASAR6.60, User'Guide.Teradyne Inc, 1999.
  • 10Somnath Deb, Krishna R. Pattipati,et al. Multi-Signal Flow Graphs: A Novel Approach for System Testability Analysis and Fault Diagnosis [A] [C]. Prec. IEEE Autotestcon, 1994: 361-373.

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