摘要
金硅面垒探测器是6LiF夹心谱仪探头的关键组成部分,其参数直接影响整个夹心谱仪的性能。通过实验测定了各金硅面垒探测器在不同偏压下的漏电电流、空气对α粒子的影响、金硅面垒的死层厚度、偏压对峰位和分辨率的影响,以及在180V偏压下各金硅面垒探测器的最大能量峰位。根据测量结果,选出了两组性能基本相同的金硅面垒探测器,将其组装成性能优良的6LiF夹心谱仪效应探头和本底探头。
The Aurum-Silicon surface barrier detector is one of the key consituents of the ^6LiF semiconductor sandwich spectrometer, which parameters will directly affect the performance of ^6LiF semiconductor sandwich spectrometer. In this paper, leakage current, dead-thickness, the effect of air on α partical, the effect of bias on the peak position and resolution under different bias and largest energy peak position under 180V bias for Aurum-Silicon surface barrier detectors are experimentally measured. Based on the measurment results, two groups of Aurum-Silicon surface barrier detectors with similar performance are choosed to form the effective ^6LiF Semiconductor sandwich spectrometer and the background spectrometer.
出处
《核动力工程》
EI
CAS
CSCD
北大核心
2008年第5期94-97,共4页
Nuclear Power Engineering
关键词
^6LiF夹心谱仪
金硅面垒探测器
能量分辨率
死层
^6LiF Semiconductor sandwich spectrometer, Aurum-Silicon surface barrier detector, Energy resolution, Death-thickness
