摘要
介绍了支持JTAG标准的数字集成电路(IC)芯片结构、故障测试模式和运用边界扫描故障测试的原理。实验中分析了数字IC互连故障类型、一般故障诊断流程和互连故障的测试方法,提出了采用无误判抗混淆算法的IC边界扫描互连故障诊断法。通过两块Xilinx 9572 pc84芯片互连电路板进行了实验验证,结果表明,该方法对板级互连故障测试具有定位准确、检测效率高、可靠性高及易于实现的技术优势。
The IC chips structure which supports JTAG standard, fault test model and fault diagnosis principles of the boundary scan test bus were introduced. In the experiment, the fault type of IC interconnection, the fault diagnosis flow and the test principles were analyzed, and a kind of fault diagnosis algorithm of no aliasing and anti-confounding were proposed. This diagnosis method was realized on the PCB interconnected by two pieces of Xilinx 9572 pc84 chips. It is manifested that the method is with advantages for accurate localizing the chip fault, high effective test, simple logic control, and can be realized conveniently.
出处
《半导体技术》
CAS
CSCD
北大核心
2008年第12期1100-1104,共5页
Semiconductor Technology
基金
国家"863"计划项目(2006AA10Z258)
关键词
JTAG标准
边界扫描结构
互连故障诊断
无误判抗混淆算法
JTAG standard
boundary scan infrastructure
interconnection fault diagnosis
no aliasing and anti-confoundin
alzorithm
