摘要
利用X射线衍射仪(XRD)和透射电子显微镜(TEM)及高分辨电子显微镜(HREM)研究了层状巨磁电阻材料La1.2-xNdxSr1.8Mn2O7(x=0.2)的显微结构.研究结果表明,Nd掺杂氧化物La1.2Sr1.8Mn2O7仍具有四方对称性,即掺杂Nd没有改变原有的晶体结构.通过HREM观察发现,Nd掺杂氧化物La1.2Sr1.8Mn2O7含有较多的缺陷,其中包括与其他RP相形成的共生结构、(101)剪切结构以及一些比较复杂的缺陷结构.
Abstract： The microstructure of layered colossal magnetoresistance material La1. 2 - xNdxSr1.8Mn2O7 （ x = 0.2） was investigated by X-ray diffraction （XRD）, transmission electron microscopy （TEM） and high-resolution electron microscopy （HREM）. The results showed that La1. 2 - xNdxSr1.8Mn2O7 （x = 0.2） is of tetragonal structure and Nd-doping has not evidently changed its structure. HREM results showed that many defects exist in the Nd-doped oxide La1. 2 - xNdxSr1.8Mn2O7, such as intergrowth structures formed between matrix and other RP phase, （101） crystallographic shear structures and some more complicated defective structures.
出处
《东北大学学报（自然科学版）》
EI
CAS
CSCD
北大核心
2009年第3期396-399,共4页
Journal of Northeastern University(Natural Science)
基金
国家自然科学基金资助项目(50572013)
关键词
巨磁阻
高分辨电子显微镜
共生结构
结晶学
结晶学剪切结构
colossal magnetoresistance
high-resolution electron microscopy （ HREM ）
intergrowth structure
crystallographic shear structure
