摘要
单光束激光Z-扫描技术是利用光束的横向特性来研究材料的光学非线性的,其灵敏度的提高有助于测量微弱折射率变化。从入射光束、调制方式、光束检测等方面论述了Z-扫描技术的灵敏度。顶环光束入射相对于标准Z-扫描技术的高斯光束入射其灵敏度可提高2.5倍,但要求光源的输出能量达到一定值,仅适用于测定较小的非线性相移;在光路中插入调制元件后放大因子可达到780,但调节光路难以调节焦移效应。利用CCD作为探测器的TPDZ-扫描技术能够测量小于λ/15000的非线性相位畸变,CCD能够充分获得光束的横向信息,有望成为另一种测量光学非线性的常用方法。
The single beam laser Z-scan technique uses transverse characteristic of the beam to study the nonlinear optical properties of materials. The Z-scan technique sensitivity enhancement contributes to the measurement of the slight refractive index changes. From the aspects of incident beams, modulation modes, and beam detection modes, the sensitivity of Z-scan tech- nique is fully expounded. Employing the top-hat beam as incident beam enhances the sensitivity to 2.5 times compared with when Gauss beam is employed in standard Z-scan technique. Inserting modulation elements, such as the phase aperture, to the light route raises the amplifying factor to 780. The TPDZ-scan technique taking CCD as the photoelectric detector can measure the nonlinear phase distortion less than λ/15000. CCD, which can fully acquire the beam transverse information, is expected to be another commonly used method in optical nonlinear measurement.
出处
《光学技术》
CAS
CSCD
北大核心
2009年第2期303-306,共4页
Optical Technique
基金
黑龙江科技学院引进人才启动基金资助项目(06-33)
