摘要
采用耦合夹钳将双指数电磁脉冲注入到RS232数据传输线中,模拟差模脉冲电压干扰,根据试验数据分析得出,RS232接口发送端口和接收端口主要因外加高压激发形成接口电路低阻通路,电路器件局部注入能量过多而受损,同时给出注入电压脉冲幅度和接口端口受损概率的Logistic模型,并以此估算出了端口正常和受损时的电压脉冲幅度上下界.
Pulse double electromagnetic is pulled into the RS232 data transmission lines by coupling damp, differential- mode pulse voltage is simulated, according to the test data, the reason will be get that that Interface Circuit of low resistance access in RS232-interface send and receive port mainly due to the stimulate formation of additional high-voltage and kral circuit devices danmged by excessive injection of energy, meanwhile presenting the Logistic model of injected voltage pulse and probability of damage to the port interface, moreover estimating the voltage pulse Range upper and lower bounds at the port in the normal and damage state.
出处
《微电子学与计算机》
CSCD
北大核心
2009年第4期252-254,259,共4页
Microelectronics & Computer
