期刊文献+

纳米化纯铁中Al扩散的深度剖析 被引量:1

Depth Profile about Diffusion of Aluminum in Nanocrystalline Iron
下载PDF
导出
摘要 纳米铁的晶粒比常规铁的晶粒小得多。铁的晶粒越小,强度和硬度越高,抗摩擦性能也越强。因此,在常规铁板表面生成的纳米铁薄层可以成为铁板的耐磨保护层。但由于纳米铁晶体存在大量的晶界,因此具有很高的活性。按照传统的腐蚀理论,晶界是腐蚀的活性区,导致纳米铁比常规铁更容易被腐蚀。实践证明,经过Al热扩散处理后的纳米铁薄层,可以降低晶界的活性,提高纳米铁薄层的抗腐蚀能力,其性能可相当于价格昂贵的高强度高抗腐蚀的高档钢板。本实验利用SIMS对Al在纳米铁薄层中热扩散行为进行深度剖析。 Size of nanostructured Fe grain is much smaller than that of ordinary ones, which causes higher hardness, higher strength and better wear resisitance. Therefore nanostructured-Fe flim, growing up on the surface of ordinary Fe, can be used as wear resisitant layer. Nevertheless, nano-Fe is very high in its activity for the reason of its numerous boundaries. According to the traditional theories of corrosion, grain boundaries are active zones, which causes that nano-Fe is easier to corrosion than ordinary ones. After treatment with Aluminium diffusion in nano-Fe film, reducing activity of grain boudaries, raising wear resistance of nano-Fe film was proved by practice. The performance is equivalent to premium steel plates of high strength and wear resistance, but with high cost. SIMS (secondary ion mass spectrometry) was used for depth profiling of thermal diffusion of Al in nano-Fe film in this experiment. The depth of Aluminium diffusion in nano-Fe film is much deeper than normal-Fe.
出处 《质谱学报》 EI CAS CSCD 2009年第2期114-117,共4页 Journal of Chinese Mass Spectrometry Society
基金 上海市纳米中心(项目编号"0452nm004")资助
关键词 表面纳米化 Al扩散 表面机械研磨处理 Fe nanocrystalline Aluminium diffusion surface mechanical attrition treatment
  • 相关文献

参考文献6

  • 1张志昆 崔作林.纳米技术与纳米材料[M].北京:国防工业出版社,2000..
  • 2LU K, LU J. Surface nanocrystallization (SNC) of metallic meterials[J]. Mater Sci Eng A, 2004, (375/376/377) : 38-45.
  • 3WANGZB, TAONR, TONGWP, et al. Diffusion of chromium in nanocrystalline iron produced by means of surface mechanical treatment[J]. Acta Mater, 2003, 51:4 319-4 329.
  • 4KLUG H P, ALEXANDER L E. X-ray diffraction procedures for polycrystalline and amorphous materials[M]. New York:Wiley, 1974:661.
  • 5WILSON G R, STEVIE F A, MAGEE C W. Secondary ion mass spectrometry[M]. New York: John Wiley & Sons,1989.
  • 6BENNINGHOVEN A, RUDENAUER F G, WER- NER H W. Secondary ion mass spectrometry [M]. New York: John Wiley & Sons,1987:89.

共引文献12

同被引文献6

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部