摘要
利用光学传输矩阵理论对掺杂1维光子晶体的缺陷模进行了研究。计算和分析了缺陷层折射率、缺陷层厚度与缺陷峰的关系。得出结论:随着缺陷层厚度的增大,缺陷峰波长呈线性增加,但是当缺陷层厚度增加到一定值时,缺陷峰的个数也将不断增加;缺陷层折射率也与缺陷峰波长有线性正比关系。从而提出了一种在微波领域测量介质折射率和介电常数的有效方法。
Numerical calculating on the defect mode in the one-dimensional （l-D） photonic crystal by the optical transmission matrix method was studied. We calculated and analyzed the relationship between refractive index of the defect layer and wavelength of the defect peak and the relationship between defective layer＇s thickness and wavelength of the defect peak. It is found that with increasing of the defective layer＇s thickness, the wavelength of the defect peak increases linearly. But much more defect peaks would be found when defective layer＇s thickness comes to a constant. Additionally, refractive index of the defect layer increases linearly with the increasing wavelength of the defect peak. So, a more effective method of measuring refraction and dielectric constants in microwave field is proposed.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2009年第5期767-769,共3页
High Power Laser and Particle Beams
关键词
1维光子晶体
传输矩阵法
缺陷模
介质折射率
介电常数
one dimensional photonic crystal
transfer matrix method
defect mode
refraction
dielectric constant
