摘要
系统地介绍的了一种用特征参数和相似分类法解决能量色散Ｘ射线荧光（ＥＤＸＲＦ）分析技术中复杂基体效应影响的方法，给出了应用事例。该方法可以推广到其它复杂类型的分析对象，具有较广泛的适用性。
A new method to correct complex matrix effect in EDXRF by using characteristic pararneters and assortment simulation has been expounded in this paper, and some results of on-the-spot application are given. The method can be spread to some other complicated samples and be widely used.
出处
《核技术》
CAS
CSCD
北大核心
1998年第8期482-486,共5页
Nuclear Techniques
关键词
基体效应
特征参数
相似分类
X射线荧光分析
EDXRF, Matrix effect, Characteristic parameters, Assortment simulation
