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两个不相交集合分组测试的最优过程

An Optimal Procedure of A Group Testing on Two Disjoint Sets
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摘要 讨论了两台装置搜索两个坏硬币分组测试模型的(m,n)—问题.给出了最优测试过程,其测试次数从实质上改进了测试次数的信息论界. ?This Paper deals With (m, n) - problem on a group testing model for searching two defectives by wsing two device. An optimal test Procedure is given wlvich yields a significant improvement of information - thooretic bound.
作者 李炜 杨辉
出处 《贵州大学学报(自然科学版)》 1998年第3期148-151,共4页 Journal of Guizhou University:Natural Sciences
关键词 分组测试 测试过程 信息论界 最优过程 group testing, (m,n)-problem, model, information-theoretic bound
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参考文献6

  • 1Manvel B. Counterfeit coin problems. Math, Mag 1977, 50 (2): 90-92.
  • 2Chang G J, Hwang F, Lin S. Group testing with two defective. Dis Appl Math. 1982, 4: 97- 102.
  • 3Chang G J , Hwang F K. A group.testing on two disjoint sets. SIAM J Alg Dis Math, 1981, 2 (1):35-38.
  • 4Hwang F K. A tale of two coins. Amer Math Monthly, 1987, 2: 121-129.
  • 5Aigner M. Combinatorial Search. Wileg-Teubner, New York-Stuttgrat, 1988.
  • 6Dorfman R. The detection of defective members in large population. Ann Math Statist, 1943,14:436-440.

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