摘要
对EMD的电子微探分析(EPMA),发现有Cu的浓缩点存在,电感耦合等离子体发射光谱(ICP-AES)分析值为0.8×10-4%。通过EPMA,可以对EMD进行微观解析。
Cu was found to be concentrated by electron probe microanalysis (EPMA)of EMD. Inductively coupled plasma-atomic emission spectrometry (ICP-AES) analysis value was 0.8 × 10^-4%. Micro analysis of EMD could be taken by EPMA.
出处
《电池》
CAS
CSCD
北大核心
2009年第4期214-215,共2页
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