摘要
简述了集成电路测试数据的一些处理方法,包括临界数据的处理、异常数据的判定和剔除、测试结果有效位数的确定等;介绍了在进行集成电路性能参数测试时需要考虑的几个关键因素;对测量误差和减小测量误差的方法进行分析,使测试人员可对原始数据进行比较合理的处理;使测试值与被测集成电路的性能真值更加接近,避免对电路合格与否做出误判,从而使检验工作更加准确无误。
Methods for processing IC test data were presented, including processing of critical data, estimation and elimination of abnormal data, and definition of effective number of digit. Key factors affecting IC parameter measurement were discussed. Measurement errors were analyzed, and methods to reduce them were described, which made test results closer to actual value of the circuit under test, and helped the operator to deal with the raw data properly.
出处
《微电子学》
CAS
CSCD
北大核心
2010年第1期149-152,共4页
Microelectronics
