摘要
内建自修复技术是一种有效修复嵌入式存储器中失效单元的方法.在传统的内建自修复过程中，需要对故障地址进行多次的读写操作，功耗比较大.本文提出了一种基于地址分割的嵌入式存储器内建自修复方法.该方法将故障地址分割成两部分，对BIRA内部存储器的访问分两个步骤进行，有效简化了地址比较过程，降低了功耗.仿真试验表明，本文方法能够在实现存储器故障自修复同时显著降低修复与工作过程中产生的功耗.
To increase the memory reliability, the technology of memory built-in serf-repair is growing rapidly. During the course of repairing, the B1RA SRAM has to be accessed continually, therefore the power dissipation is dramatically high. To solve this problem, a memory built-in self-repair method based on address partitioning strategy has been proposed. This method can de- crease the power dissipation by simplify the address comparison course. Experimental results show that the proposed method can re- pair the defective cells in embedded memories and the power dissipation can be decreased simultaneously.
出处
《电子学报》
EI
CAS
CSCD
北大核心
2010年第B02期169-173,共5页
Acta Electronica Sinica
基金
装备预研重点基金(No.9140A17040409HT01)
航天支撑基金(No.2009-HT-HGD-03)
关键词
内建自修复
内建自测试
内建冗余分析
built-in self-repair
built-in self-test
built-in redundancy analysis
