摘要
介绍一种基于谱分析的混合信号BIST分析方法,包括被测电路模型建立,即利用Volterra级数来描述,阐述这种BIST测试方案。以硬件开销较小的伪随机信号作为输入激励,通过谱估计方差较小的Welch算法进行谱分析,计算出Volterra频域核来进行故障诊断,可使测量过程高效、准确。最后利用MATLAB仿真分析验证了方案的可行性,使测试方案具有较好的实用性和通用性。
This paper introduces the research of mixed-signal BIST based on spectral analysis, especially expatiated on the scheme of BIST which contains the modeling of CUT with Volterra kernel. For less cost, the pseudo-random signal is used as input stimulus;Welch algorithm is used for spectral analysis by Variance spectral estimation, and then calculates the kernel by spectral analysis to diagnose the fault. Finally MATLAB is used to simulate the feasibility of the program, so that testing programs have good practical and versatile.
出处
《国外电子测量技术》
2010年第5期21-23,共3页
Foreign Electronic Measurement Technology
基金
广西研究生教育创新计划(2009105950804M33)资助项目
