摘要
The photo-generated charge transfer characteristics of n-Si/TiO2/Azo pigment in micrometer regions was studied by means of kelvin probe force microscopy(KFM) technique.The results showed that the photo-generated electrons of Azo pigment particles transferred to n-Si/TiO2 under illumination,and a photo-induced p-n-p structure in micro-scale was observed for the first time.This result indicates that photo-generated charge transfer characteristics of organic/inorganic complex in nano-scale can be observed directly by KFM.
The photo-generated charge transfer characteristics of n-Si/TiO2/Azo pigment in micrometer regions was studied by means of kelvin probe force microscopy（KFM） technique.The results showed that the photo-generated electrons of Azo pigment particles transferred to n-Si/TiO2 under illumination,and a photo-induced p-n-p structure in micro-scale was observed for the first time.This result indicates that photo-generated charge transfer characteristics of organic/inorganic complex in nano-scale can be observed directly by KFM.
出处
《高等学校化学学报》
SCIE
EI
CAS
CSCD
北大核心
2010年第5期858-860,共3页
Chemical Journal of Chinese Universities
基金
国家"九七三"计划项目(批准号:2007CB613303)
国家自然科学基金(批准号:20703020
20873053)资助
关键词
异质结构
表面光伏特性
Kelvin探针力显微镜
光生电荷转移
Heterostructures
Surface photovoltage character
Kelvin probe force microscopy（KFM）
Photo-generated charges transfer
