摘要
针对传统的可控硅模拟测试仪器存在操作不便的缺点,提出了一种基于ARM7及LCD显示的数字化可控硅测试仪设计方案,给出总体设计思路及相关测量电路原理图,并着重介绍系统测试原理及高、低测量电压源的设计思路。综合应用各种措施,解决高压泄露导致系统工作的不可靠问题,最后给出系统软件设计思想及部分测试结果。样机5 s内测出可控硅的各项常规参数,测量结果直观、准确,操作方便。
Based on the ARM7 and the LCD digital display,a novel scheme for test the parameters of SCR is proposed,which can provide the more convenient in measurement and overcome the faults of the traditional measure instruments for the SCR testing.The summary strategy for solving the problem and schematic diagram are presented.The theory of test system and the circuit of measure equipment are introduced.The unreliability of instrument caused by the high-voltage leak can be improved.Software design and some of the test results are presented.The results show that the normal parameters of test can be obtained within 5 s,and the test accurate of SCR can be ensured,the control for SCR is easy.
出处
《半导体技术》
CAS
CSCD
北大核心
2010年第7期650-653,690,共5页
Semiconductor Technology
