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红外探测系统自身热辐射杂散光的分析 被引量:33

Analysis of Stray Light Caused by Thermal Radiation of Infrared Detection System
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摘要 设计了Ritchey-Chretien(R-C)型红外探测系统及其遮光罩,运用软件TracePro建立了结构模型,通过光线追迹分析了系统的几个关键内表面自身热辐射杂散光。给出了温度范围为250K^320K时,几个关键内表面热辐射产生的杂散光光子数随温度变化的关系。计算了天空背景的杂散光,同时给出了单像元接收到的杂散光光子数增加的速率随温度变化的关系。分析结果表明,常温下使用没有主镜筒的开架式望远镜结构对减小杂散光的效果并不明显。如果要实现背景限探测,系统主镜内遮光罩的温度至少降低至230K。 A typical infrared detection system [Ritchey-Chretien(R-C)system] and its baffles are designed.Its structure model is established with the TracePro software.Stray lights caused by thermal radiation of critical inner surface are analyzed by a ray tracing program.The relation of photons of stray lights and temperature which varies from 250 K to 320 K is given.The stray light caused by sky background is calculated.The curve of increasing rate of photon number of stray lights received by single pixel versus temperature is given.The results show that an open telescope without main tube cannot do well obviously in reducing stray lights.The temperature of the inner baffle of main mirror should be less than 230 K in order to detect the background-limited target.
出处 《光学学报》 EI CAS CSCD 北大核心 2010年第8期2267-2271,共5页 Acta Optica Sinica
关键词 红外探测 杂散光 TracePro软件 热辐射 里奇-克雷季昂系统 infrared detection stray light TracePro software thermal radiation Ritchey-Chretien(R-C)system
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