摘要
一种新的矿物微区成分分析技术与矿物探针分析仪主要针对显晶或隐晶矿物的成分分析。该分析仪是以能量色散X射线荧光分析原理为物理基础,采用X光管和X聚焦透镜组成微束X射线激发源、以电致冷Si-PIN半导体探测器为X射线探测器和数字X射线谱采集器组成能量色散射线X荧光分析系统;采用40倍光学放大和CCD相机相合实现微区的显微放大,通过程控三轴微控台实现微区的定位。该探针分析仪能够实现对样品表面Φ35μm范围内多元素定性与定量分析,快速鉴定矿石的物质成分,精确度好于10%(RSD)。测定对象可以是天然岩石、矿石及其光片、薄片样品等;可应用于野外条件下的现场和驻地的岩矿石矿物的微区快速成分分析。
This paper introduces the development of microbeam and microdomains X-ray mineral probe analyzer.The instrument can analyze and measure the elements and their content in a small area of mineral sample with non-destructive analyzing.Micobeam and microdomains X-ray mineral probe analyzer is based on the theory of energy-dispersive X-ray fluorescence analysis.The combination of X-ray tube and lens produce a focal spot with a diameter of 35 μm to determine mineral.The surface of mineral is amplified and displayed by the CCD camera,so the position of mineral surface can be accurately located.For the advanced design,Micobeam and microdomains X-ray mineral probe analyzer provide qualitative analysis and quantitative analysis to the mineral surface with the diameter of 35 μm.
出处
《矿物岩石》
CAS
CSCD
北大核心
2010年第3期105-108,共4页
Mineralogy and Petrology
基金
国家自然科学基金(40774063)
中国地质大调查(1212010706501)
关键词
微束微区分析
矿物
X荧光分析
microbeam and microdomain analysis
mineral
X-ray
