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光通信系统中数字配线架电接触不良的影响 被引量:4

Effects of the Electric Contact Failure of DDF in OpticalCommunication System
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摘要 基于现场搜集的连接器,分析了可能导致电接触不良的因素,并且根据电接触理论结合高频传输的特点建立了通信系统中电触点的物理模型.最后以光通信系统中数字配线架(DDF)上的同轴连接器为例,探讨了电触点故障导致误码率增高的可能性. Based on the contact theory and the analysis of the failed connectors collected on spots, The factors which can result in contacts failure and proposes a new physical model of contacts in high frequency is discussed. The theoretical studies of the relationship between the contact failure of DDF and the error codes in optical communication systems are given.
出处 《北京邮电大学学报》 EI CAS CSCD 北大核心 1999年第3期73-77,共5页 Journal of Beijing University of Posts and Telecommunications
关键词 同轴连接器 电接触 误码率 接触阻抗 光通信 coaxial connectors contact failure error code rate contact impedance
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参考文献5

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同被引文献26

  • 1Zhang J G. The effect of environment on electric contact reliability-a summary report on recent achievement[C]. Proceedings of the 21st International Conference on Electrical Contacts, 2002: 205-211.
  • 2Malucci R. High frequency considerations for points contact interfaces[C]. Proceeding of 47th IEEE Holm Conference on Electrical Contacts, 2001: 175-185.
  • 3Malucci R. The impact of contact resistance on high speed digital signal transmission[C]. Proceeding of 48th IEEE Holm Conference on Electrical Contacts, 2002: 212-220.
  • 4Lavers J, Timsit R. Constriction resistance at high signal frequencies[J]. IEEE Transaction on Components and Packaging Technologies, 2002, 25(3): 446- 452.
  • 5Takano E. Contact current distortion due to tunnel effect[C]. Proceeding of 46th IEEE Holm Conference on Electrical Contacts, 2000: 169-175.
  • 6Vladimirescu M, Kwiatkowski R, Engel K. Tunnel conduction in high frequency microcontacts: passive intermodulation effect[C]. Proceeding of 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts, 2004 152-159.
  • 7Holm R. Electric contacts-theory and application[M]. Berlin: Springer-Verlag, 2000.
  • 8Timsit R. High speed electronic connectors: a review of electrical contact properties[J]. IEICE Transaction on Electronics, 2005, E88-C(8): 1532-1545.
  • 9Wager H N.Impact of the contact on electrical systems[C]∥ Proceedings of the Holm Seminar on Electrical Contacts.Chicago:IEEE Press,1976:1-14.
  • 10Liang Y N,Zhang J G,and Liu J J.Identification of inorganic compounds in dust collected in Beijing and their effects on electric contacts[C]∥Proceedings 43rd IEEE Holm Conference on Electric Contacts.Philadelphia:IEEE Press,1997:315-327.

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