摘要
带冗余的集成电路的成品率的估计对制造者来说是一个非常重要的问题。文中将集中分析和讨论带冗余的成品率模型和可靠性，给出了该领域研究进展的最新结果，并指出了进一步研究的方向和策略。
It is an important problem to estimate the IC yield with redundance for manufacturers. Our emphasis is on analyzing and discussing the functional yield with redundance and reliability. In this paper, the researching development and the newest results of IC faulttolerant design are given, and the further researching direction and strategy are pointed out.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
1999年第2期129-138,共10页
Research & Progress of SSE
基金
国防科技预研基金
