摘要
在单片机外围扩展中,模拟至数字转换器(ADC)常用的标准电路在采样芯片和单片机之间需要多个元件对信号进行转换,虽然精度很高,但结构复杂,成本较高。该文对某些特定条件下用单片机进行ADC采样的方法进行了初步的探索,利用单片机直接与ADC0809进行连接,通过单片机产生各种时钟和控制信号来完成ADC采样,简化了采样的线路。对比了该电路与传统电路的差别,并讨论了该采样方法的使用条件和应用参数。
To develop the periphery circuits of MCU, the standard Analog-to-Digital Converter（ADC） circuit needs several ICs between MCU and sample IC to convert the signals. This brings high precision, but also complicated structure and high cost. The ADC sampling method with MCU in some specific conditions is introduced in this paper. We connect ADC 0809 with MCU directly, and produce all ADC CLK signals and control signals by the MCU, which greatly simplifies the sampling circuit. In this paper, we compare this circuit with the classic circuit, and discuss the operating condition and application parameters of this sampling method.
出处
《计算机与网络》
2010年第20期47-50,共4页
Computer & Network
