摘要
简要介绍ANSI/ESD S20.20静电放电防护控制方案,具体分析了静电放电对元器件造成的失效模式,并对静电放电损伤模型进行了深入比较分析。针对电子元器件检测实验室,依照ANSI/ESD S20.20标准规范化、系统化地提出了一套较为完善的静电防护体系。
The paper briefly introduces the ANSI/ESD S20.20 specification,analyzes the frequently occurring fault modes of the electronic part and component in detail and wholly compares the damage model of static discharge. Aiming at the requirement of the testing lab, it provides a completive ESD architecture construction according to the ANSI/ESD S20.20 specification.
出处
《国外电子测量技术》
2010年第10期78-80,共3页
Foreign Electronic Measurement Technology
