摘要
针对新型电子装备功能与结构复杂、测试诊断难度大的问题,基于IEEE1149标准,提出了电子装备可测试性设计方法,系统地分析了模块级产品可测试性设计的内容,提出了器件与测试接口设计要求,阐述了测试扫描链路设计方法,并进一步研究了测试信号完整性设计技术,并结合电子装备计算机体系结构,设计了系统级测试性设计框架;通过实际验证,该项技术对于边界扫描器件互连测试覆盖率达100%,可以提高装备测试性设计水平,满足了电子装备测试诊断的需求。
The function and configuration of new type electrical equipments is complicated,so the test and diagnosis is very difficult.Based on the IEEE1149 standard,the testability method is proposed.The content of testability design is analyzed systematically,the requirement for devices and the test port is proposed,the design method of the test scan chain is suggested,signal integrity design technique of test signals are researched further.Combined with the computer architecture of electrical equipments,the system testability application framework is designed.The practice result indicates that interconnect test coverage for the boundary scan devices up to 100%,the technique can increase the testability level and meet the test and diagnostics needs of electrical equipments effectively.
出处
《计算机测量与控制》
CSCD
北大核心
2010年第12期2710-2712,共3页
Computer Measurement &Control
