摘要
随着大规模集成电路的发展,电子设备的结构越来越微型化、复杂化,复杂电子系统抗电磁脉冲容限不断降低,在强电磁脉冲的干扰下极易造成系统的性能降级、损伤甚至爆炸。针对强电磁脉冲的破坏作用,以高空核爆电磁脉冲(HEMP)为例,分析强电磁脉冲的特性和研究强电磁脉冲效应的数值计算方法,并基于时域有限差分法(FDTD)仿真分析了双层金属腔体在HEMP平面波作用下的孔缝耦合过程,得到了有利于指导腔体电磁防护设计的结论。
With the development of large scale integrated circuits,electronic devices become increasingly miniaturized and complex in structure.The tolerance of complex electronic systems against electromagnetic pulse becomes lower and lower,which may easily result in performance degradation,damage or even explosion of system under electromagnetic pulse interference.Considering the destructive effects of electromagnetic pulse,high-altitude electromagnetic pulse（HEMP） is taken into account.The characteristics of electromagnetic pulse and the numerical methods for studying electromagnetic pulse effect are analyzed,then the aperture coupling process of double-layer metal cavities under HEMP plane wave is simulated using FDTD.The conclusions provide a guidance for the protection design of metal cavities.
出处
《无线电工程》
2011年第1期38-40,共3页
Radio Engineering
关键词
复杂电子系统
强电磁脉冲
效应
complex electronic systems
electromagnetic pulse
effect
