摘要
本文针对自动检定系统中如何处理被检器具检定有效期问题,在LabVIEW开发环境中设计了计算程序,并对子VI的创建和使用方法进行了描述,对从事自动检定系统开发者具有极高的参考、借鉴价值。
The paper mainly introduced how to calculate re-testing period of instruments in labVIEW. It designed a program in LabVIEW and described the building and using of the sub VI. It set a reference to the programmers who works on automatic testing system.
出处
《仪器仪表标准化与计量》
2010年第6期47-48,共2页
Instrument Standardization & Metrology
关键词
检定
计算
有效期
Testing Calculating Re-Testing Period
