摘要
应用４１９２Ａ低频阻抗分析仪测量了不同温度下的ＹＳＺ薄膜的阻抗谱．利用Ｂａｕｅｒｌｅ等效电路模型研究了ＹＳＺ薄膜的电导率随温度的变化规律；探讨了掺杂氧化物（Ｙ２０３）对ＹＳＺ薄膜电导率的影响．其结果表明：ＹＳＺ薄膜的阻抗谱是一个完整的半圆，圆心稍低于实轴．在５００℃时，ＹＳＺ薄膜的电导率为０．０１４Ω－１ｃｍ－１，且随着测试温度的升高，ＹＳＺ薄膜的电导率增大；稳定剂浓度对ＹＳＺ薄膜的电导率有显著影响，当含量为９％（ｍｏｌ／ｍｏｌ）时达到最大值．关键词##4ＹＳＺ薄膜;;阻抗谱;;
The impedance spectrums of YSZ thin films have been measured by 4192A low frequence compleximpedance meters at different testing temperature. The regUlar between conductivity of YSZ Ibm films and temperature has been stUdied by using Bauerle mode. The effect of additionokide(Y2O3 ) on conductivity of YSZ thin filmshas been researched. These result showed that the impedance spetrums of YSZ thin films were well - defined sendcireles and the center of the semicircles was below the real axis. At 500 ℃, Ihe conduchvity of YSZ thin films was0. 014 Ω- 1 cm- 1, and the conduchyity increased with the testing temperatUre rising. The concentration of stabilizer(Y2O3 )was Obviously effective on the conduchvity of YSZ thin films, when the concent of Y2O3 is 9 % (mol/mol),the conductivity of YSZ films was the maxium.
出处
《湖北大学学报（自然科学版）》
CAS
1999年第2期134-137,共4页
Journal of Hubei University：Natural Science
