摘要
在系统芯片SoC测试中,测试时间与测试功耗是两个互相影响的因素。多目标进化算法能够处理相互制约的多目标同时优化问题。在无约束条件下,对SoC测试时间与测试功耗建立联合优化模型,并采用多目标进化算法中的改进型非劣分类遗传算法(Non-dominated sorting genetic algorithmⅡ,NSGA-Ⅱ)对模型进行求解。通过应用ITC’02标准电路中的p93791做应用验证,结果表明该方法能够给出模型的均衡解,证明了模型的实用性和有效性。
In the test of System-on-Chip（SoC）,test time and test power were in the restrict condition to each other.The multi-objective evolutionary algorithm can achieve the simultaneous optimization.The paper constructed the com-bined optimization model for test time and test power under no constraining,applied NSGA-Ⅱ to deal with the combined optimization model,and adopted ITC＇02 Benchmark circuit p93791 to verify the algorithm.The results show that the NSGA-Ⅱ algorithm can generate balance solutions,and the test model is practical and effective.
出处
《电子测量与仪器学报》
CSCD
2011年第3期226-232,共7页
Journal of Electronic Measurement and Instrumentation
基金
国家自然科学基金项目(编号:60861003)资助项目
