摘要
把测试优选问题映射为一个带约束的集合覆盖问题,运用DNA计算模式中的粘贴模型来求解测试优选问题.用存储复合体来表示子集,并利用粘贴运算的巨大并行性,来有效地获得满足测试目标的测试集.实验结果表明,此方法有效地减少了测试的数量,并且计算过程与测试集中列向量顺序无关,同时测试集中不含冗余测试.
Test selection can be mapped to the weighted set cover problem.Computation based on sticking operations is introduced to sovle the test selection optimization.With the aid of sticker medel,the minirnal set eovering problem can be solved by transforming the subset to memory complex and utilizing the massive Parallelism of sticking oprations.Experiment results show that the method effectively reduces the number of the test and ensures that no redundant test left in the optimal test set is obtained.
出处
《武汉理工大学学报（交通科学与工程版）》
2011年第2期341-344,共4页
Journal of Wuhan University of Technology（Transportation Science & Engineering）
基金
湖北省自然科学基金项目资助(批准号:2007ABA262)
关键词
测试优选
粘贴模型
集合覆盖
test selection
sticker model
set-covering problem
