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基于FPGA的NAND Flash ECC校验 被引量:7

NAND Flash ECC Check-Out Based on FPGA
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摘要 基于Flash存储器的Hamming编码原理,在Altera Quartus II 7.0开发环境下,实现ECC校验功能。测试结果表明,该程序可实现每256 Byte数据生成3 Byte的ECC校验数据,能够检测出1 bit错误和2 bit错误,对于1 bit错误还能找出其出错位置并予以纠正,可应用于NAND Flash读写控制器的FPGA设计,保证数据传输的可靠性。 ECC checkout is achieved based on hamming encoder in Altera Quartus II 7.0 environment.Experimental results show this procedure realizes each 256 bytes born 3 bytes ECC check-out data.Moreover,it can not only ensure single-bit and double-bit detection,but also locate the error and correct it,which can be applied to FPGA design of Read-Write Controller to realize the ECC check-out and guarantee reliability of data transmission.
作者 吕小微
出处 《电子科技》 2011年第6期34-37,共4页 Electronic Science and Technology
关键词 ECC校验 FPGA NAND FLASH 读写控制器 ECC check-out FPGA NAND Flash read-write controller
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