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机载计算机BIT虚警及解决策略研究 被引量:13

A Study of Built-In Test False Alarm in An Airborne Computer
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摘要 机内测试(Built-in Test,BIT)技术是改善系统或设备测试性和维修性的重要途径,通过在机载计算机中设计专门的BIT电路,配合专门的BIT软件,以达到大幅度提高机载计算机的可靠性和安全性的目的。但是较高的虚警率一直是阻碍BIT技术在机载计算机中广泛应用的一个重要原因。文章在对机载计算机BIT虚警机理模式进行分析的基础上,提出一种新型的机载计算机BIT虚警问题的分析方法,并给出BIT设计策略及关键技术解决方案。经过实例分析证明该策略明显降低了虚警率,提高了机载计算机的可靠性及可维护性。 Aim. The introduction of the full paper reviews a number of papers in the open literature, and they show that the high false alarm rate is the important reason why BIT technology cannot be widely applied. The core of Section 1 consists of: (1) we make a careful analysis of false alarm problem in regular BIT(built-in test) technology, the analysis shows that 50% of the inherent false alarms exist in regular BIT technology. (2) we apply the Bayesian theory to the analysis of false alarm rate and establish the Bayesian model of the false alarm problem. (3) we prove that the transient fault is an important reason for the high false alarm rate and low fault detection rate, and that eliminating the influence of the transient fault can improve the fault detection rate and reduce the false alarm rate. Based on these conclusions, we suggest a new BIT algorithm. In Section 2, we put forward a BIT design of a serial port channel which is the core-part of the airborne computer. The test results of the design are given in Table one, and they show that the algorithm reduces the false alarm rate by about 40% and significantly increases the reliability and maintainability of the airborne computer.
出处 《西北工业大学学报》 EI CAS CSCD 北大核心 2011年第3期400-404,共5页 Journal of Northwestern Polytechnical University
基金 国家自然科学基金(60134010)资助
关键词 BIT 机载计算机 可靠性 可维护性 BIT, airborne computer, reliability, maintainability
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参考文献6

  • 1徐永成,温熙森,易晓山.机内测试虚警原因的分析及其解决方案[J].振动.测试与诊断,2002,22(1):37-42. 被引量:14
  • 2Drees R, Young N. Role of BIT in Support System Maintenance and Availability. IEEE Trans Aerospace and Electronic Systems Magazine, 2004, 19(8) : 3 -7.
  • 3Sheppard J W, Kaufman M A. A Bayesian Approach to Diagnosis and Prognosis Using Built-In Test. IEEE Trans on Instrumen- tation and Measurement, 2005, 54(3) : 1003 - 1018.
  • 4张小林.小型飞行器机载计算机的余度设计技术[J].西北工业大学学报,2001,19(2):274-278. 被引量:32
  • 5Chen Pu, Xu Hengcheng. Aviation Electron System BIT Summary. China Water Transport(Academic Version), 2002, 6 (2) : 108 - 110.
  • 6Woell A J J. Application of Trend Analysis Methodologies on Built-in-Test (BIT) (and Non-BIT) Systems in a Operational U S. Navy Fighter/Attack Squadron. Instrumentation and Measurement Technology Conference, Ottawa, Canada, 2005, 17 - 19.

二级参考文献9

  • 1[1]Simpson W R, Sheppard J W. Analysis of false alarms during system design. In:IEEE 1992 Autotestcon. Dayton, Ohio, 1992.657~660
  • 2[3]Rosenthal D, Wadell B C. Predicting and eliminating built-in test false alarm. IEEE Trans. on Reliabili-ty, 1990, 39(4):500~505
  • 3[4]Press R E, Elerin L M. The application of neural network technology to built-in test false alarm filtering. AIAA-93-4715-CP, 1993.1389~1398
  • 4[6]Zbytniewski J, Cooper C. CNDs and RTOKs:are we addressing these problems correstly? In:1994 Proc. of Naecon. Dayton, OH, 1994.402~410
  • 5[7]Sorensen B A, Kelly G. An analyzer for detecting intermittent faults in electronic devices. In:IEEE 1994 Autotestcon. New York, 1994.417~421
  • 6Wu N E,Proceedings of 35th Conf on Decision and Control,1996年,126页
  • 7姚一平,可靠性及余度技术,1991年,181页
  • 8罗志强,航空电子综合化系统,1990年,129页
  • 9温熙森,徐永成,易晓山.智能理论在BIT设计与故障诊断中的应用[J].国防科技大学学报,1999,21(1):97-101. 被引量:24

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