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斜入射法检测平面反射镜的面形误差 被引量:9

Surface Error Measurement of Plane Mirrors Based on Oblique Incidence
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摘要 为实现用小口径面形干涉仪完成对大口径光学镜面面形的检测,发展了斜入射检测方法,增大投射到待测镜上光斑的尺寸,从而增大干涉仪检测的镜面口径范围。推导了斜入射法检测平面反射镜面形的公式,并考虑了此方法可能引入的误差。对尺寸为124 mm×42 mm的平面反射镜分别在垂直和不同斜入射角条件下进行了测量,垂直入射时测得镜子工作表面面形起伏高度均方根(RMS)和峰谷(PV)值分别为16.3 nm和67.8 nm,斜入射时测得镜子工作表面的面形起伏高度RMS和PV值分别为16.8 nm和68.7 nm,相对误差分别为3%和0.9%,可以满足第三代同步辐射光束线的要求。 In order to measure the surface shape of large aperture plane mirrors by using smaller caliber laser interferometer, oblique incidence method is developed. Thus, the spot illuminated on the tested mirror is magnified, and the size range that the interferometer can measure is much bigger. The plane mirror surface shape expression based on oblique incidence is gained, and the errors that may be introduced are concerned. And a plane mirror with size of 124 mmX42 mm is measured using vertical incidence and oblique incidence with different incidence angles. The surface height root mean square (RMS) and peak-to-valley (PV) results of the test mirror are 16.3 nm and 6?. 8 nm based on vertical incidence and 16.8 nm and 68.7 nm based on oblique incidence. Compared with vertical incidence measurement results, the relative error value of RMS is 3 %, and the relative error value of PV is 0.9 %. The result can satisfy the requirement of the third generation synchrotron radiation beam lines.
出处 《激光与光电子学进展》 CSCD 北大核心 2011年第7期85-90,共6页 Laser & Optoelectronics Progress
关键词 测量 镜面面形 斜入射法 ZYGO干涉仪 斜率误差 measurement surface shape of mirror oblique incidence ZYGO interferometer slope error
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  • 1耿则勋,王振国.改进的天文斑点图像高清晰重建方法[J].光学精密工程,2007,15(7):1151-1156. 被引量:8
  • 2刘昕,唐宝玲.基于样本的图像修补[J].西安理工大学学报,2005,21(1):51-54. 被引量:8
  • 3肖体乔,徐至展,陈建文,朱佩平,寇雷刚,程亚.全息图的数字重现[J].光学学报,1995,15(2):129-134. 被引量:21
  • 4P.Takacs,S.N.Qian,J.Colbert Design of a long trace surface profiler[C].SPIE,1987,749:59-64
  • 5P.Takacs,S.N.Qian.Surface profiling interferometer[P].US Patent No.U4884697,Dec.5,1989
  • 6K V.Bieren.Pencil beam interferometer for aspheric optical surfaces[C].SPIE,1982,343:101-108
  • 7S.C Irick W.R.McKinney,D.L.Lunt et al..Vsing a straightness reference in obtaining more accurate surface profiles from a long trace profiler(for synchrotron optics)[J].Rev.Sci.Instr.,1992,63:1436-1438
  • 8S.N.Qian,P.Takacs.Equal optical path beam splitters for a pencil beam interferometer and shearing interferometer[J].Opt.Eng.,2003,42(4):929-934
  • 9S.C.Irick.Error reduction techniques for measuring long synchrotron mirrors[C].SPIE,1998,3447:101-108
  • 10Y.Zhao,Z.Li,D.Li et al..Principle of π-phase plate long trace profiler for synchrotron radiation optics[J].OPt.Commun.,2001,200(1-6):23-26

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