期刊文献+

AlGaN/GaN异质结中二维电子气多子带解析建模

Multiple sub-bands analytical model of 2DEG properties in the Al_xGa_(1-x)N/GaN heterostructure
下载PDF
导出
摘要 为了能够方便精确地研究AxlGa1-xN/GaN异质结中二维电子气性质,提出一种多子带二维电子气的解析模型.利用此模型能够求出二维电子气能带、子能级、波函数和量子特性的解析解.通过模型计算还可以得到二维电子气的分布变化、面电子密度、基带能级、费米能级和势阱随Al组分及AlGaN层厚度的改变.与泊松-薛定谔自洽求解结果相比较,此模型能够给出精确的结论,并避免了泊松-薛定谔自洽求解复杂的数值计算和耗时长等缺点. To analyze a nitride heterostructure using a simple method, an analytic model is developed for the AlGaN/GaN heterostructure to study two-dimensional electron gas (2DEG) properties. The model is analytical for the energy band, sub-band level and wave function of 2DEG. A comparison of analytical results with complex self-consistent results of the Poisson-Schrodinger equation shows that the complicated numerical calculation and the disadvantage of time-consuming are avoided. We can obtain the variety of 2DEG distribution and sheet density and the shape of the potential well with Al content and thickness of the AlGaN barrier layer using the analytic model.
出处 《西安电子科技大学学报》 EI CAS CSCD 北大核心 2011年第5期147-151,共5页 Journal of Xidian University
基金 国家自然科学基金资助项目(60976068 61076097) 教育部科技创新工程重大项目培育基金资助项目(708083) 十二五国家部委预研资助项目(513080401)
关键词 AlxGa1-xN/GaN异质结 二维电子气 多子带模型 能级分布 AlGaN/GaN heterostructure two-dimensional electron gas multiple sub-bands model distribution of energy level
  • 相关文献

参考文献12

  • 1Lee S N, Cho S Y, Ryu H Y, et al. High-power GaN-based Blue-violet Laser Diodes with A1GaN/GaN Multiquantum Barriers [J]. Appl Phys Lett, 2006(88): 111101.
  • 2Xing H L, Dora Y, Chini A, et al. High Breakdown Voltage A1-GaN-GaN HEMTs Achieved By Multiple Field Plates [ J]. IEEE Electron Dev Lett, 2004(25): 161-163.
  • 3王冲,张金风,郝跃,冯倩,杨燕,张进城.AlGaN/GaN HEMT在N_2中高温退火研究[J].西安电子科技大学学报,2006,33(6):862-865. 被引量:2
  • 4Ambacher O, Smart J, Shealy J R, et al. Two-dimensional Electron Gases Induced By Spontaneous and Piezoelectric Polarization charges in N-and Ga-face A1GaN/GaN Heterostructures [ J]. J Appl Phys, 1999(85): 3222.
  • 5张金风,郝跃.GaN-based heterostructures: electric-static equilibrium and boundary conditions[J].Chinese Physics B,2006,15(10):2402-2406. 被引量:1
  • 6Shur M S. GaN and Related Materials for High Power Applications [J]. Mater Res Soc Syrup Proc, 1998(483) : 15-26.
  • 7Martin G, Strite S, Botchkarev A, et al. Valence-band Discontinuity between GaN and AIN Measured By x-ray Photoemission Spectroscopy [J]. Appl Phys Lett, 1994(65): 610.
  • 8Martin G, Botchkarev A, Rockett A, et al. Valence-band Discontinuities of Wurtzite GaN, A1N, and InN Heterojunctions Measured By X-ray Photoemission Spectroscopy [ J]. Appl Phys Lett, 1996(68): 2541.
  • 9Polonovski J P, Tomizawa K. Phonon Scatterings of Quasi Two-Dimensional Electron Gas in a Single Heterostructure [ J]. J J Appl Phys, 1985(24): 1611-1618.
  • 10Kim M H, Shen L, Martinez T J, et al. Conformationally Controlled Chemistry: Excited-State Dynamics Dictate Ground-State Reaction [ J]. Science, 2007(315) : 1561-1565.

二级参考文献11

  • 1王冲,郝跃,张进城.AlGaN/GaN HEMT研制及特性分析[J].西安电子科技大学学报,2005,32(2):234-236. 被引量:7
  • 2王晓亮,刘新宇,胡国新,王军喜,马志勇,王翠梅,李建平,冉军学,郑英奎,钱鹤,曾一平,李晋闽.X-Band GaN Power HEMTs with Power Density of 2.23 W/mm Grown on Sapphire by MOCVD[J].Journal of Semiconductors,2005,26(10):1865-1870. 被引量:3
  • 3Majewski J A, Zandler G and Vogl P 2000 Phys. Stat. Sol. (a) 179 285
  • 4Tan I H, Snider G L, Chang L D and Hu E L 1990 J.Appl. Phys. 68 4071
  • 5Koley G and Spencer M G 2001 J. Appl. Phys. 90 337
  • 6Jogai B 2002 J. Appl. Phys. 91 3721
  • 7Ridley B K, Ambacher O and Eastman L F 2000 Semicond. Sci. Technol. 15 270
  • 8Ridley B K 2004 Semicond. Sci. Technol. 19 446
  • 9Zhang J F, Zhang J C and Hao Y 2004 Chin. Phys. 13 1334
  • 10Fiorentini V, Bernardini F and Ambacher O 2002 Appl.Phys. Lett. 80 1204

共引文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部