摘要
本文对象面全息无损检测方法进行了实验研究，结果表明该方法可用白光再现；同时，对于小缺陷可进行放大成象，从而提高了对小缺陷的判别精度。
The image-plane holographic method for non-destructive testing has been researched experimentally in this paper. It is shown that double-exposure hologram can be directly reconstructed by using convergent white-light,and the small defects can such be enlarged through imaging lens that the measurement precision for these defects would thus be effectively enhanced.
出处
《光子学报》
EI
CAS
CSCD
1996年第2期180-182,共3页
Acta Photonica Sinica
关键词
象面全息
白光再现
小缺陷
Image-plane holography
White-light reconstruction
Small defect
