摘要
An on-axis phase-shifting reflective point-diffraction microscopic interferometer for quantitative phase microscopy based on Michelson architecture is proposed. A cube beamsplitter splits the object wave spectrum into two copies within two arms. Reference wave is rebuilt in one arm by low-pass filtering on the object wave frequency spectrum with a pinhole-mask mirror, and interferes with the object wave from the other arm. Polarization phase-shifting is performed and phase imaging on microscale specimens is implemented. The experimental results demonstrate that the proposed scheme has the advantage of long-term stability due to its quasi common-path geometry with full use of laser energy.
An on-axis phase-shifting reflective point-diffraction microscopic interferometer for quantitative phase microscopy based on Michelson architecture is proposed. A cube beamsplitter splits the object wave spectrum into two copies within two arms. Reference wave is rebuilt in one arm by low-pass filtering on the object wave frequency spectrum with a pinhole-mask mirror, and interferes with the object wave from the other arm. Polarization phase-shifting is performed and phase imaging on microscale specimens is implemented. The experimental results demonstrate that the proposed scheme has the advantage of long-term stability due to its quasi common-path geometry with full use of laser energy.
基金
supported by the National Natural Science Foundation of China under Grant Nos. 61077005,61107003,and 10874240
