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金属化膜脉冲电容器剩余寿命预测方法研究 被引量:13

Residual Lifetime Prediction of Metallized Film Pulse Capacitors
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摘要 金属化膜脉冲电容器是惯性约束聚变激光装置的重要元器件之一,其寿命预测是激光装置维护和备件决策制定的依据.在分析金属化膜脉冲电容器退化失效机理的基础上,采用Wiener过程描述其性能退化过程.进一步考虑到各电容器之间的差异,将Wiener过程的漂移参数和扩散参数看成随机变量,提出了随机效果Wiener过程模型,由同一批电容器的历史性能退化数据拟合其分布.在对单个电容器进行寿命预测时,采用Bayes方法融合电容器总体信息与该电容器自身的性能退化信息,得到其剩余寿命参数的验后估计,因而在电容器性能退化数据较少时采用该方法能提高剩余寿命预测精度. The metallized film capacitor is one of the most important types of components of the laser driver in inertial fusion facility.The residual lifetime of the capacitor is of great value in maintenance and spare parts decision making.We used the Wiener process to model the degradation process based on an analysis of the capacitance degradation mechanism of the metallized film capacitor.Taking the inherent difference of each capacitor into consideration,we proposed to use the Wiener process with random effect,where the drift and diffusion parameters of the Wiener process were treated as random variables,whose distribution were estimated using the degradation data from other capacitors from the same batch.When predicting the residual lifetime of a particular capacitor,a Bayesian method was used to integrate its degradation data and the batch information.Posterior distribution of the residual lifetime parameters were deduced.The proposed method can improve the precision of prediction when its degradation data are few.
出处 《电子学报》 EI CAS CSCD 北大核心 2011年第11期2674-2679,共6页 Acta Electronica Sinica
基金 国家自然科学基金(No.60701006 60804054 71071158)
关键词 金属化膜脉冲电容器 剩余寿命预测 BAYES方法 WIENER过程 信息融合 metallized film pulse capacitor residual lifetime prediction Bayesian method Wiener process information fusion
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参考文献15

  • 1M A Newton,D W Larson,R L Anderson et al.Power conditioning development for the national ignition facility .in Proceedings of SPIE Second International Conference on Solid State Lasers for Application to Inertial Confinement Fusion .Paris:SPIE-International Society for Optical Engine,1996.
  • 2N Gebraeel,A Elwanty,J Pan.Residual life predictions in the absence of prior degradation knowledge[J].IEEE Transactions on Reliability,2009,58(1):106-117.
  • 3N Gebraeel,J Pan.Prognostic degradation models for computing and updating residual life distributions in a time-varying environment[J].IEEE Transactions on Reliability,2008,57(4):539-550.
  • 4N Gebraeel,M Lawley,R Li et al.Residual-life distributions from component degradation signals:A Bayesian approach[J].IIE Transactions,2005,37(6):543-557.
  • 5X X Yuan,A Pandey.A nonlinear mixed-effects model for degradation data obtained from in-service inspections[J].Reliability Engineering and System Safety,2009,94(2):509-519.
  • 6X Wang.Wiener processes with random effects for degradation data[J].Journal of Multivariate Analysis,2008,102(2):340-351.
  • 7Q Sun,J Zhou,Z Zhong et al.Gauss-poisson joint distribution model for degradation failure[J].IEEE Trans on Plasma Science,2004,32(5):1864-1868.
  • 8J Zhao,F Liu.Reliability assessment of the metallized film capacitors from degradation data[J].Microelectronic Reliability,2007,47(2-3):434-436.
  • 9赵建印,刘芳,孙权,周经伦.基于性能退化数据的金属化膜电容器可靠性评估[J].电子学报,2005,33(2):378-381. 被引量:26
  • 10赵建印,刘芳,孙权,周经伦.金属化膜脉冲电容器在线可靠性评估与性能预计[J].兵工学报,2006,27(2):265-268. 被引量:6

二级参考文献13

  • 1郭大德.金属化膜电容器的损耗分析及损坏机理[J].电力电容器,1995(2):12-15. 被引量:27
  • 2J B Ennis et al.Self-healing pulse capacitors for the national ignition facility(NIF)[A].Proceeding of 12th IEEE International Pulsed Power Conference[C].Monterey(USA),1999.118.
  • 3D Larson,F W MacDougall,P Hardy et al.The impact of high energy density capacitors with metallized electrode in large capacitor banks for nuclear fusion application[A].The 9th IEEE Pulsed Power Conference[C].Albuquerque,NM,USA,1993.
  • 4YANG K,XUE J.Continuous state reliability analysis[C].Proc of Annual Reliability and Maintainability Symp,1996:251-257.
  • 5Chinnam R B.On-line reliability estimation for individual components using statistical degradation signal models[J].Quality and Reliability Engineering International,2002,18:53-73.
  • 6Cox D R,Miller H D.The theory of stochastic processes[M].Methuen and Company,1965:220-222.
  • 7Ennis J B,Macdougall F W,Cooper R A,et al.Self-healing pulse capacitors for the national ignition facility(NIF)[C].IEEE Pulsed Power Conference,1999:118-121.
  • 8Nelson W.Accelerated Testing:Statistical models,test plans,and data analysis[M].New York:John Wiley & Sons,1990:117-120.
  • 9Meeker W Q,Escobar L A.Statistical methods for reliability data[M].New York:John Wiley & Sons,1998:231-238.
  • 10LU C J,Meeker W Q.Using degradation measures to estimate a time-to-failure distribution[J].Technometrics,1993,35(2):161-174.

共引文献80

同被引文献102

  • 1司小胜,胡昌华,周东华.带测量误差的非线性退化过程建模与剩余寿命估计[J].自动化学报,2012,38(1):1471-1484.
  • 2SI X SH, WANG W B, HU CH H, et al. Remaining useful life estimation-A review on the statistical data driven approaches[J]. European Journal of Operational Research,2011,213(1) : 1-14.
  • 3WANG X. Wiener processes with random effects for degradation data[ J ]. Journal of Multivariate Analysis, 2010,101 (2) : 340-351.
  • 4CHERNICK J R. Bootstrapping methods: A practitioner's guide[J]. IIE Transactions, 2003,35 (6) : 583-583.
  • 5MEEKER W Q, ESCOBAR L A. Statistical methods for reliability data[J]. New York: Wiley. corn, 1998.
  • 6Si X S, Wang W, Hu C H, et al. A Wiener process based deg- radation model with a recursive filter algorithm for remaining useful life estimation[J]. Mechanical Systems and Signal Pro- cessing, 2013, 35(1/2):219-237.
  • 7Tsai C C, Tseng S T, Balakrishnan N. Mis-specification analy- ses of gamma and Wiener degradation processes[J]. Journal of Statistical Planning and Inference ,2011,141(12) :3725 - 3735.
  • 8Wang X. Wiener processes with random effects for degradation data[J]. Journal of Multizriate Analysis ,2010,101(2) :340 - 351.
  • 9Ntzoufras I. Bayesian Modeling Using WinBUGS [M]. New York : Wiley, 2009.
  • 10Lan H, Liang Y, Pan Q, et al. An EM algorithm for multipath state estimation in OTHR target tracking[J]. IEEE Trans. on Signal Processing, 2014, 62(11) :2814-2826.

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