摘要
介绍了用X射线等效能量法计算双组分物质质量厚度的方法,该方法在计算过程中采用单组分物质的等效质量衰减系数来替代双组分的等效质量衰减系数。通过射线吸收模拟实验,理论上计算了该方法的误差,结果表明在理论计算的双组分样品厚度范围内,该方法可以达到很好的精度,具备可行性。同时讨论了不同高压组合对质量厚度计算误差的影响。发现在固定一个高压的前提下,存在一个最佳低压,可以使质量厚度计算误差最小。
A method of mass thickness measurement for dual samples was introduced.The method used equivalent mass attenuation coefficients of single sample to substitute for that of dual samples during the computing process.The errors were computed by simulated experiments.It was found that the method could reach a good accuracy with the computed dual samples and it was a feasible way.The effects of different high voltages combinations were also discussed.It was found that when one high voltage was preset there was an optimization low voltage which would lead to a least relative error for the mass thickness computed.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2011年第11期1245-1249,共5页
Nuclear Electronics & Detection Technology
基金
南京工程学院引进人才科研启动基金项目(121107090001)
关键词
双能
X射线
等效能量
质量厚度
最佳低压
dual energy
X-ray
equivalent energy
mass thickness
optimization combination
