摘要
电子器件的低频噪声通常由闪烁(1/f噪声)噪声、g-r噪声和爆裂噪声3种成分构成。这些噪声通常与晶体管表面状态或内部缺陷有关,其中,1/f噪声已成为对器件的质量评估及可靠性预测的重要指标。提出分形分析方法,对1/f噪声性能进行分析。仿真实验结果验证了该方法的可行性,为今后用分形理论研究器件低频噪声提供了理论依据。
Low frequency noise of electronic device usually consists of 1/f noise,g-r noise and burst noise.They are usually related to transistor surface condition or internal defects.1/f noise has been become an important index in the device of quality assessment and reliability prediction.According to its irregular and singularity everywhere,this paper adopts fractal analysis method to analyze 1/f noise' s performance.The simulation results show that this method can be used effectively in device reliability analysis.
出处
《河南科技大学学报（自然科学版）》
CAS
北大核心
2012年第1期28-31,6,共4页
Journal of Henan University of Science And Technology:Natural Science
基金
吉林省自然科学基金项目(20101519)
关键词
低频噪声
1/f噪声
分形分析
Low frequency noise
1/f noise
Fractal analysis
