摘要
X光底片作为记录缺陷形状、大小、数量的介质,其好坏对于无损检测人员做出正确分析和判断至关重要。总结了三门CV底封头拍摄过程中X光底片上伪缺陷产生的原因,并提出了相应的防止方法,可为以后的工作提供参考。
As a medium to reflect defect shape, size and quantity, the quality of X-ray film is critical for NDE （Non-Destructive Examination） personnel to make correct analyses and judgments. This paper summarized the attributes that generated false defects in X-ray films taken for Sanmen Unit 1 Containment Vessel Bottom Head, and put forward the corresponding preventive methods for future reference.
出处
《无损检测》
2012年第2期68-69,共2页
Nondestructive Testing
关键词
安全壳
X光底片
伪缺陷
防止办法
Containment vessel
X-ray films
False defect
Preventive methods
