摘要
本文提供了一种测定金属硅中B、Fe、Al、Ca、Mn等 14个杂质元素的ICP AES方法。在样品处理过程中 ,加入适量体积的甘露醇能够抑制B的挥发。用本方法测定了一个国家地球化学标准样 (GSR 4 ) 。
In this paper,an ICP AES method for determining Al,B,Ba,Ca ets impuries in silicon metal is described.The interference factors in the analysis of impurity elements in silicon metal has been studied.The problems of background interference,organic matter(mannitol)interference,major elements interference are discussed.In the procedure of sample preparation,a proper volume of mannitol solution was added to sample,and this can protect B from volatilization.The feasibility of the proposed method is evaluated by analyzing one national geochemical reference samples(GSR 4),The results are satisfactory.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
2000年第1期71-73,共3页
Spectroscopy and Spectral Analysis
