摘要
运用程序占空比概念及故障注入技术对星用微处理器动态和静态单粒子翻转率间的关系进行了研究,并将预估结果与国外在轨飞行监测数据进行了对比。结果表明,由程序占空比计算所得动态单粒子翻转率可对星用微处理器在轨单粒子翻转率进行合理预估;故障注入技术是灵活、方便的动态单粒子翻转率预估方法。
In this article, the relationship between static SEU （Single Event Upset） rate and dynamic SEU rate in microprocessors for satellites is studied by using process duty cycle concept and fault injection technique. The results are compared to in-orbit flight monitoring data. The results show that dynamic SEU rate by using process duty cycle can estimate in-orbit SEU rate of microprocessor reasonable; and the fault injection technique is a workable method to estimate SEU rate.
出处
《核技术》
CAS
CSCD
北大核心
2012年第3期201-205,共5页
Nuclear Techniques
关键词
星用微处理器
单粒子翻转率
程序占空比
故障注入
Microprocessor for satellites, SEU rates, Process duty cycle, Fault injection
