摘要
首次报道了利用光学显微法和同步辐射白光X射线形貌术对Cr∶KTP晶体缺陷的研究结果。光学显微法采用热磷酸作为腐蚀剂 ,用Opton大型显微镜反射法观察 ,观测到 (10 0 )面和 (0 2 1)面的位错蚀坑以及 (0 2 1)面的小角度晶界。用同步辐射白光X射线形貌术作出 (0 0 1)面、(0 10 )面和(10 0 )面形貌图 ,从图中可明显观察到生长层、扇形界及位错线。由此得出 ,Cr∶KTP晶体的主要缺陷是位错、生长扇形界、生长层等。
The defects of Cr∶KTP crystals have been studied by optical micrography and white beam synchrotron radiation topography.In optical micrography,the samples were etched by hot phosphoric acid and observed by reflection method with Opton microscope.The etch pits of dislocation on (021),(100) faces and the low angle grain boundaries on (021) face were revealed.And the growth striation,sector boundaries and dislocation have been shown by means of synchrotron radiation topography.It is the conclusion that the main defects in the crystals are growth sector boundaries,growth stripes,and dislocation.
出处
《人工晶体学报》
EI
CAS
CSCD
北大核心
2000年第1期69-72,共4页
Journal of Synthetic Crystals
基金
山东省自然科学基金
山东大学晶体材料国家重点实验室开发经费资助
关键词
形貌
非线性光学晶体
缺陷
掺铬
磷酸钛氧钾晶体
Cr∶KTP crystals
white beam synchrotron radiation topography
defects
nonlinear optic crystal
