摘要
随着电子技术的飞速发展,电路的集成度越来越高,使其测试面临越来越多的问题。可测性设计成为解决测试问题的主要手段之一,而边界扫描技术是众多可测性设计方法中使用较为广泛的一种。在深入研究IEEE1149.1及IEEE1149.4标准的基础上,对基于边界扫描可测性结构进行了探索,具有重要的理论价值和实际意义。
With rapid development of electronic technology,the integrated degree of circuits has greatly increased,more and more problems have to be faced in the field of test.The technology of DFT（design for testability） is one of the key solutions to deal with the problems of test.And the boundary-scan technology is a kind of the DFT methods,which is used widely.With intensive study on IEEE std 1149.4 and IEEE std 1149.1,this paper explores the testability structure based on boundary-scan,the result of the paper has important theory value and practical significance.
出处
《国外电子测量技术》
2012年第4期34-37,共4页
Foreign Electronic Measurement Technology
