摘要
原子力显微镜(AFM)是纳米科学研究的有力工具。从AFM的原理出发,分析了探针与样品之间作用力的计算过程,介绍了确定悬臂弹性常数的几种方法,并综述了AFM在生物材料、薄膜材料、纳米结构、单分子操作和纳米力学实验中的研究进展。
Atomic force microscopy (AFM) is a powerful tool for nanoscience research. Based on the principle of AFM, calculation process of the force between probe and sample is analysed, some methods for determining the spring constant of cantilevers are introduced. Further more, a review on recent developments of application of AFM is given for nanoscale materials, biomechanics and electronic device.
出处
《材料导报》
EI
CAS
CSCD
北大核心
2012年第13期118-124,共7页
Materials Reports
基金
国家自然科学基金(51002128)
关键词
原子力显微镜
微尺度材料
力学性能
探针
悬臂弹性常数
AFM, nano- and micro-scale materials, mechanical property, probe, cantilever spring constant