摘要
为研究过电应力对半导体分立器件可靠性的影响,以国产ZL20螺栓形整流二极管为例,建立整流二极管基本失效率模型,揭示半导体分立器件性能和可靠性的主要影响因素,提出预防半导体分立器件失效的措施。试验结果表明:给出的ZL20螺栓形整流二极管基本失效率模型反映了其失效规律,可以应用于工程实践。
In order to understand the effect of electrical overstress to the reliability of semi conductive separated apparatuses,this paper introduced main effective factors on capability and reliability of semi-conductive separated apparatuses by setting up ZL20 bolt-shaped diode as a basic model.It also put forward the measures to prevent invalidation of semi-conductive separated apparatuses.The experimental results show that the basic invalidation rate of model ZL20 bolt shaped diode obey the given invalidation rule,which can be applied to engineering practice.
出处
《中国测试》
CAS
北大核心
2012年第6期87-90,共4页
China Measurement & Test
关键词
过电应力
失效分析
半导体分立器件
可靠性
模型
electrical overstress
failure analysis
semi-conductive separated apparatus
reliability
model
