摘要
用长距离显微镜和摄象系统获取的表面细观裂纹图像 ,由于光线等因素的影响 ,常模糊不清 ,且夹杂大量的伪劣纹 .为了得到与宏观变形响应同步的表面裂纹的定量描述 ,必须对图像进行技术处理 ,重置像素点的像素值 ,去除伪裂纹 .对表面裂纹的处理主要分两大步进行 :一是根据像素点的灰度值的不同提取表面裂纹 .这样 ,由表面气泡引起的圆孔等缺陷也同时被提取出来 ;二是去除伪劣纹 (如气泡引起的圆孔 ) 。
The meso crack images on the specimen surface, acquired by long microscope connected with CCD, are often obscure because of light and others. At the same time, many false cracks are often included. In order to describe surface cracks synchronous with macro deformation in quantity, the images of crack must be processed and false cracks must be deleted. The two steps should be included: One is to extract cracks according to the difference of gray value, in which false cracks are also included; the other is to delete false cracks.
出处
《东南大学学报（自然科学版）》
EI
CAS
CSCD
2000年第3期80-83,共4页
Journal of Southeast University：Natural Science Edition
基金
江苏省自然科学基金资助项目! (BK970 0 5)
