期刊文献+

垒层p型掺杂量的分布对InGaN基发光二极管性能的影响

Influence of p-doping Distribution in Barriers on the Performance of InGaN Based Light-Emitting Diodes
下载PDF
导出
摘要 采用APSYS软件分析了InGaN基发光二极管的垒层中p型掺杂量的分布及其作用.结果表明,当所有的p型掺杂量集中于最后一个垒层时,发光二极管的发光强度最大,大注入电流下的效率衰减量最小.其主要原因是优化了垒层中p型掺杂量的分布有利于电子限制和空穴注入. The blue InGaN based light -emitting diodes (LEDs) with constant total p -doping amount in barriers but different doping distribution have been numerically studied by the APSYS simulation software in this paper. The simulation results demonstrated that with more p - doping amount centralized in the last barrier, higher output power was illustrated. In the meanwhile, the efficiency droop was markedly improved at injection current of 200 mA. It is mainly attributed to more efficient electron blocking and hole injection as well as lower electron leakage current.
出处 《华南师范大学学报(自然科学版)》 CAS 北大核心 2013年第2期60-63,共4页 Journal of South China Normal University(Natural Science Edition)
基金 国家自然科学基金项目(51172079) 广州市科技攻关项目(11A52091257)
关键词 发光二极管 GAN INGAN 多量子阱 Light emitting diodes GaN InGaN Multiple quantum wells
  • 相关文献

参考文献12

  • 1KIM M H, SCHUBERT M F, DAI Q, et al. Origin of ef?ficiency droop in GaN - based light - emitting diodes [J]. Appl Phys Lett, 2007,91: 183507.
  • 2SCHUBERT M F, XU J, KIM J K, et al. Polarization?matched GainN/ AIGainN multi - quantum - well light - emitting diodes with reduced efficiency droop [J]. Appl Phys Lett, 2008,93:041102.
  • 3DING K, ZENG Y P, WEI X C, et al. A wide - narrow well design for understanding the efficiency droop in In-GaN/GaN light - emitting diodes [J]. Appl Phys B: La?sers Opt, 2009, 97: 465 - 468.
  • 4SHEN Y C, MUELLER G 0, WATANABE S, et al. Au?ger recombination in InGaN measured by photolumines?cencej J ]. ApplPhys Lett, 2007,91:141101.
  • 5KIM A Y, GO W, STEIGERWALD D A, et al. Perform?ance of high - power AlInGaN light emitting diodes [J]. Phys Status Solidi A, 2001,188 :15 -21.
  • 6WANG C H, CHEN J R, CHIU C H, et al. Temperature - dependent electroluminescence efficiency in blue In?GaN - GaN light - emitting diodes with different well widths[J]. IEEE Photon Technol Lett, 2010, 22:236- 238.
  • 7BOCHKAREV A N I, VORONENKOV V V, GOR?BUNOV R I, et al. Defect - related tunneling mechanism of efficiency droop in III - nitride light - emitting diodes [J]. Appl Phys Lett, 2010, 96:l33502.
  • 8DAVID A, GRUNDMANN M J, KAEDING J F, et al. Carrier distribution in (001)InGaN/GaN multiple quan?tum well light - emitting diodes [J]. Appl Phys Lett, 2008, 92 :053502.
  • 9HAN S H, LEE D Y, LEE S J, et al. Effect of electron blocking layer on efficiency droop in InGaN/GaN multiple quantum well light - emitting diodes [J]. Appl Phys Lett, 2009 ,94 :231123.
  • 10HAN S H, CHO C Y, LEE S J. et al. Effect of Mg do?ping in the barrier of InGaN/GaN multiple quantum well on optical power of light - emitting diodes [J]. Appl Phys Lett, 2010, 96:0511l3.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部