期刊文献+

Determination of interface states and their time constant for Au/SnO_2 /n-Si (MOS) capacitors using admittance measurements

Determination of interface states and their time constant for Au/SnO_2 /n-Si (MOS) capacitors using admittance measurements
原文传递
导出
摘要 The frequency dependence of admittance measurements (capacitance–voltage (C–V ) and conductance–voltage (G/ω–V )) of Au/SnO2 /n-Si (MOS) capacitors was investigated by taking into account the effects of the interface states (N ss ) and series resistance (Rs ) at room temperature. Admittance measurements were carried out in frequency and bias voltage ranges of 1 kHz–1 MHz and ( 5V)–(+9V), respectively. The values of N ss and R s were determined by using a conductance method and estimating from the admittance measurements of the MOS capacitors. At low frequencies, the interface states can follow the AC signal and yield excess capacitance and conductance. In addition, the parallel conductance (G p /ω) versus log(f) curves at various voltages include a peak due to the presence of interface states. It is observed that the N ss and their time constant (τ) range from 1.23 ×10 12 eV-1 ·cm-2 to 1.47 ×10 12 eV-1 ·cm-2 and from 7.29 ×10-5 s to 1.81 ×10-5s, respectively. The frequency dependence of admittance measurements (capacitance–voltage (C–V ) and conductance–voltage (G/ω–V )) of Au/SnO2 /n-Si (MOS) capacitors was investigated by taking into account the effects of the interface states (N ss ) and series resistance (Rs ) at room temperature. Admittance measurements were carried out in frequency and bias voltage ranges of 1 kHz–1 MHz and ( 5V)–(+9V), respectively. The values of N ss and R s were determined by using a conductance method and estimating from the admittance measurements of the MOS capacitors. At low frequencies, the interface states can follow the AC signal and yield excess capacitance and conductance. In addition, the parallel conductance (G p /ω) versus log(f) curves at various voltages include a peak due to the presence of interface states. It is observed that the N ss and their time constant (τ) range from 1.23 ×10 12 eV-1 ·cm-2 to 1.47 ×10 12 eV-1 ·cm-2 and from 7.29 ×10-5 s to 1.81 ×10-5s, respectively.
机构地区 Department of Physics
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第4期429-433,共5页 中国物理B(英文版)
关键词 MOS capacitor admittance measurements interface states MOS capacitor admittance measurements interface states
  • 相关文献

参考文献30

  • 1Nicollian E H and Brews J R 1982 MOS (Metal Oxide Semiconductor) Physics and Technology (New York: John Wiley & Sons).
  • 2Grove A S 1967 Physics and Technology of Semiconductor Devices (New York: John Wiley & Sons).
  • 3Sze S M and Kwok K Ng 2007 Physics of Semiconductor Devices 3rd edn. (New Jersey: John Wiley & Sons).
  • 4Tataro?lu A 2011 J. Optoelectron. Adv. Mater. 13 940.
  • 5Sato K and Yasamura Y 1985 J. Appl. Phys. 58 3656.
  • 6Pakma O, Serin N, Serin T and Altindal ? 2008 J. Phys. D: Appl. Phys. 41 215103.
  • 7Chattopadhyay P and RayChaudhuri B 1992 Solid State Electron. 35 1023.
  • 8Rhoderick E H and Williams R H 1988 Metal-Semiconductor Contacts 2nd edn. (Oxford: Clarendon Press).
  • 9Nicollian E H and Goetzberger A 1965 Appl. Phys. Lett. 7 216.
  • 10Kelberlau U and Kassing R 1979 Solid State Electron. 22 37.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部