摘要
SoC(System-on-a-Chip)芯片设计中,由于芯片测试引脚数目的限制以及基于芯片性能的考虑,通常有一些端口不能进行测试复用的IP(Intellectual Property)核将不可避免地被集成在SoC芯片当中.对于端口非测试复用IP核,由于其端口不能被直接连接到ATE(Automatic Test Equipment)设备的测试通道上,由此,对端口非测试复用IP核的测试将是对SoC芯片进行测试的一个重要挑战.在本文当中,我们分别提出了一种基于V93000测试仪对端口非测试复用ADC(Analog-to-Digital Converter)以及DAC(Digita-l to-Analog Converter)IP核的性能参数测试方法.对于端口非测试复用ADC和DAC IP核,首先分别为他们开发测试程序并利用V93000通过SoC芯片的EMIF(External Memory Interface)总线对其进行配置.在对ADC和DAC IP核进行配置以后,就可以通过V93000捕获ADC IP核采样得到的数字代码以及通过V93000采样DAC IP核转换得到的模拟电压值,并由此计算ADC以及DAC IP核的性能参数.实验结果表明,本文分别提出的针对端口非测试复用ADC以及DAC IP核测试方案非常有效.
IP cores without I/O multiplexing are typically unavoidable to be embedded into SoC due to the necessary considerations such as pin constraint and performance optimization during the design stage.Hence,one of the serious challenges for SoC testing is how to effectively test IP cores without I/O multiplexing because the ports of IP cores without I/O multiplexing cannot be directly connected to the ATE channels.In this paper,we propose test methods for ADC and DAC IP cores without I/O multiplexing using V93000 ATE respectively.In order to test the ADC and DAC IP cores without I/O multiplexing,test programs are firstly developed and loaded into V93000 to configure the two cores via EMIF bus.Then the digital codes and the analog voltage values respectively converted by ADC and DAC IP cores of SoC are captured by V93000 for performance parameter calculation.Experimental results show that the proposed methods are effective.
出处
《电子学报》
EI
CAS
CSCD
北大核心
2013年第7期1358-1364,共7页
Acta Electronica Sinica
基金
中国博士后科学基金特别资助(No.2012T50092)
中国博士后科学基金面上资助(No.2011M500321)
